Cite
Study of Design Factors Affecting Turn-on Time of Silicon Controlled Rectifiers (SCRS) in 90 and 65nm Bulk CMOS Technologies.
MLA
Di Sarro, J., et al. “Study of Design Factors Affecting Turn-on Time of Silicon Controlled Rectifiers (SCRS) in 90 and 65nm Bulk CMOS Technologies.” 2006 IEEE International Reliability Physics Symposium Proceedings, Jan. 2006, pp. 163–68. EBSCOhost, https://doi.org/10.1109/RELPHY.2006.251210.
APA
Di Sarro, J., Chatty, K., Gauthier, R., & Rosenbaum, E. (2006). Study of Design Factors Affecting Turn-on Time of Silicon Controlled Rectifiers (SCRS) in 90 and 65nm Bulk CMOS Technologies. 2006 IEEE International Reliability Physics Symposium Proceedings, 163–168. https://doi.org/10.1109/RELPHY.2006.251210
Chicago
Di Sarro, J., K. Chatty, R. Gauthier, and E. Rosenbaum. 2006. “Study of Design Factors Affecting Turn-on Time of Silicon Controlled Rectifiers (SCRS) in 90 and 65nm Bulk CMOS Technologies.” 2006 IEEE International Reliability Physics Symposium Proceedings, January, 163–68. doi:10.1109/RELPHY.2006.251210.