Breakdown pattern identification in high temperature dielectric films using scanning electron microscopy (SEM).

Details

Language :

English

ISBNs :

9780780379107

Database :

Complementary Index

Journal :

2003 Annual Report Conference on Electrical Insulation & Dielectric Phenomena

Publication Type :

Conference

Accession number :

80772759

Full Text :

https://doi.org/10.1109/CEIDP.2003.1254844