Cite
Breakdown pattern identification in high temperature dielectric films using scanning electron microscopy (SEM).
MLA
Ul-Haq, S., and G. Raju. “Breakdown Pattern Identification in High Temperature Dielectric Films Using Scanning Electron Microscopy (SEM).” 2003 Annual Report Conference on Electrical Insulation & Dielectric Phenomena, Jan. 2003, pp. 265–68. EBSCOhost, https://doi.org/10.1109/CEIDP.2003.1254844.
APA
Ul-Haq, S., & Raju, G. (2003). Breakdown pattern identification in high temperature dielectric films using scanning electron microscopy (SEM). 2003 Annual Report Conference on Electrical Insulation & Dielectric Phenomena, 265–268. https://doi.org/10.1109/CEIDP.2003.1254844
Chicago
Ul-Haq, S., and G. Raju. 2003. “Breakdown Pattern Identification in High Temperature Dielectric Films Using Scanning Electron Microscopy (SEM).” 2003 Annual Report Conference on Electrical Insulation & Dielectric Phenomena, January, 265–68. doi:10.1109/CEIDP.2003.1254844.