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Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators.

Authors :
Koga, R.
Crain, S.H.
Crawford, K.B.
Moss, S.C.
LaLumondiere, S.D.
Howard, J.W., Jr.
Source :
2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear & Space Radiation Effects Conference (Cat. No.00TH8527); 2000, p53-60, 8p
Publication Year :
2000

Details

Language :
English
ISBNs :
9780780364745
Database :
Complementary Index
Journal :
2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear & Space Radiation Effects Conference (Cat. No.00TH8527)
Publication Type :
Conference
Accession number :
80766190
Full Text :
https://doi.org/10.1109/REDW.2000.896269
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