Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators.

MLA

Koga, R., et al. “Single Event Transient (SET) Sensitivity of Radiation Hardened and COTS Voltage Comparators.” 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in Conjunction with IEEE Nuclear & Space Radiation Effects Conference (Cat. No.00TH8527), Jan. 2000, pp. 53–60. EBSCOhost, https://doi.org/10.1109/REDW.2000.896269.

APA

Koga, R., Crain, S. H., Crawford, K. B., Moss, S. C., LaLumondiere, S. D., & Howard, J. W., Jr. (2000). Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators. 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in Conjunction with IEEE Nuclear & Space Radiation Effects Conference (Cat. No.00TH8527), 53–60. https://doi.org/10.1109/REDW.2000.896269

Chicago

Koga, R., S.H. Crain, K.B. Crawford, S.C. Moss, S.D. LaLumondiere, and J.W. Howard Jr. 2000. “Single Event Transient (SET) Sensitivity of Radiation Hardened and COTS Voltage Comparators.” 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in Conjunction with IEEE Nuclear & Space Radiation Effects Conference (Cat. No.00TH8527), January, 53–60. doi:10.1109/REDW.2000.896269.