Electrical characterization of InGaN/GaN quantum dots by deep level transient spectroscopy.

Details

Language :

English

ISSN :

03701972

Volume :

241

Issue :

12

Database :

Complementary Index

Journal :

Physica Status Solidi (B)

Publication Type :

Academic Journal

Accession number :

62453600

Full Text :

https://doi.org/10.1002/pssb.200405068