Back to Search Start Over

Exposure Assessment for Retrospective Follow-Up Studies of Semiconductor- and Storage Device-Manufacturing Workers.

Authors :
Herrick, Robert F.
Stewart, James H.
Blicharz, Drew
Beall, Colleen
Bender, Thomas
Hong Cheng
Matthews, Robert
Sathiakumar, Nalini
Delzell, Elizabeth
Source :
Journal of Occupational & Environmental Medicine; Oct2005, Vol. 47 Issue 10, p983-995, 13p
Publication Year :
2005

Details

Language :
English
ISSN :
10762752
Volume :
47
Issue :
10
Database :
Complementary Index
Journal :
Journal of Occupational & Environmental Medicine
Publication Type :
Academic Journal
Accession number :
18846009
Full Text :
https://doi.org/10.1097/01.jom.0000177128.50822.01