Exposure Assessment for Retrospective Follow-Up Studies of Semiconductor- and Storage Device-Manufacturing Workers.

MLA

Herrick, Robert F., et al. “Exposure Assessment for Retrospective Follow-Up Studies of Semiconductor- and Storage Device-Manufacturing Workers.” Journal of Occupational & Environmental Medicine, vol. 47, no. 10, Oct. 2005, pp. 983–95. EBSCOhost, https://doi.org/10.1097/01.jom.0000177128.50822.01.

APA

Herrick, R. F., Stewart, J. H., Blicharz, D., Beall, C., Bender, T., Hong Cheng, Matthews, R., Sathiakumar, N., & Delzell, E. (2005). Exposure Assessment for Retrospective Follow-Up Studies of Semiconductor- and Storage Device-Manufacturing Workers. Journal of Occupational & Environmental Medicine, 47(10), 983–995. https://doi.org/10.1097/01.jom.0000177128.50822.01

Chicago

Herrick, Robert F., James H. Stewart, Drew Blicharz, Colleen Beall, Thomas Bender, Hong Cheng, Robert Matthews, Nalini Sathiakumar, and Elizabeth Delzell. 2005. “Exposure Assessment for Retrospective Follow-Up Studies of Semiconductor- and Storage Device-Manufacturing Workers.” Journal of Occupational & Environmental Medicine 47 (10): 983–95. doi:10.1097/01.jom.0000177128.50822.01.