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Enhanced Thermoelectric Performance of a HfS2 Bilayer by Strain Engineering.

Authors :
Wang, Hao
Xiang, Juan
Dai, Bo
Ge, Ni-Na
Zhang, Xiao-Wei
Ji, Guang-Fu
Source :
Journal of Electronic Materials; Oct2023, Vol. 52 Issue 10, p6537-6550, 14p
Publication Year :
2023

Abstract

For two-dimensional transition metal dichalcogenides, the thermoelectric properties of the material are affected by layer thickness and lattice strain. In this paper, we investigate the thermoelectric properties of a HfS<subscript>2</subscript> bilayer under different biaxial tensile strains by first-principles calculations combined with Boltzmann equations. The presence of degenerate bands in the HfS<subscript>2</subscript> bilayer and the absence of its monolayer results in the better thermoelectric performance of the HfS<subscript>2</subscript> bilayer than its monolayer. Moreover, this strain increases the band degeneracy of the HfS<subscript>2</subscript> bilayer even more, and the degenerate bands and stepped 2D density of states lead to a high power factor. In addition, the lattice strain increases the phonon scattering rate and reduces the phonon lifetime of the HfS<subscript>2</subscript> bilayer, resulting in a decrease in the lattice thermal conductivity. Ultimately, we obtained a maximum ZT value of 1.76 for the unstrained HfS<subscript>2</subscript> bilayer at the optimal doping concentration. At this time, its power factor and thermal conductivity are 53.01 mW/mK<superscript>2</superscript> and 9.06 W/mK, respectively. When the strain reaches 3%, for the n-type doped HfS<subscript>2</subscript> bilayer, the power factor and thermal conductivity are 69.87 mW/mK<superscript>2</superscript> and 6.36 W/mK, respectively, and the maximum ZT value is 3.29. For the p-type doped HfS<subscript>2</subscript> bilayer, the maximum ZT value appears at 6% strain, which is 1.83, at which the power factor and thermal conductivity are 13.81 mW/mK<superscript>2</superscript> and 2.27 W/mK, respectively. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03615235
Volume :
52
Issue :
10
Database :
Complementary Index
Journal :
Journal of Electronic Materials
Publication Type :
Academic Journal
Accession number :
171345150
Full Text :
https://doi.org/10.1007/s11664-023-10443-5