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Defect Characterization of Multicycle Rapid Thermal Annealing Processed p-GaN for Vertical Power Devices.
- Source :
- ECS Journal of Solid State Science & Technology; 2019, Vol. 8 Issue 2, pP70-P76, 7p
- Publication Year :
- 2019
Details
- Language :
- English
- ISSN :
- 21628769
- Volume :
- 8
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- ECS Journal of Solid State Science & Technology
- Publication Type :
- Academic Journal
- Accession number :
- 135554885
- Full Text :
- https://doi.org/10.1149/2.0011902jss