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Predicting the yield of photonic integrated circuits using statistical compact modeling.
- Source :
- Proceedings of SPIE; 5/19/2017, Vol. 10242, p1-13, 13p
- Publication Year :
- 2017
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 10242
- Database :
- Complementary Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Conference
- Accession number :
- 124156787
- Full Text :
- https://doi.org/10.1117/12.2268845