Predicting the yield of photonic integrated circuits using statistical compact modeling.

MLA

Pond, James, et al. “Predicting the Yield of Photonic Integrated Circuits Using Statistical Compact Modeling.” Proceedings of SPIE, vol. 10242, May 2017, pp. 1–13. EBSCOhost, https://doi.org/10.1117/12.2268845.

APA

Pond, J., Klein, J., Flückiger, J., Xu Wang, Zeqin Lu, Jhoja, J., & Chrostowski, L. (2017). Predicting the yield of photonic integrated circuits using statistical compact modeling. Proceedings of SPIE, 10242, 1–13. https://doi.org/10.1117/12.2268845

Chicago

Pond, James, Jackson Klein, Jonas Flückiger, Xu Wang, Zeqin Lu, Jaspreet Jhoja, and Lukas Chrostowski. 2017. “Predicting the Yield of Photonic Integrated Circuits Using Statistical Compact Modeling.” Proceedings of SPIE 10242 (May): 1–13. doi:10.1117/12.2268845.