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Coupling capacitance extraction in through-silicon via (TSV) arrays.
- Source :
- 2015 IEEE International Conference on Electronics, Circuits & Systems (ICECS); 2015, p470-473, 4p
- Publication Year :
- 2015
Details
- Language :
- English
- ISBNs :
- 9781509002467
- Database :
- Complementary Index
- Journal :
- 2015 IEEE International Conference on Electronics, Circuits & Systems (ICECS)
- Publication Type :
- Conference
- Accession number :
- 115631703
- Full Text :
- https://doi.org/10.1109/ICECS.2015.7440350