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A quantitative investigation of the influence with the components of the CMP alkali slurry on the polishing rate.

Authors :
Fan Shiyan
Liu Enhai
Zhang Jun
Liu Yuling
Wang Lei
Lin Kai
Sun Ming
Shi Lukui
Source :
Journal of Semiconductors; Sep2015, Vol. 36 Issue 9, p1-1, 1p
Publication Year :
2015

Details

Language :
English
ISSN :
16744926
Volume :
36
Issue :
9
Database :
Complementary Index
Journal :
Journal of Semiconductors
Publication Type :
Academic Journal
Accession number :
109921899
Full Text :
https://doi.org/10.1088/1674-4926/36/9/096001