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Depth dependence for extended x-ray-absorption fine-structure spectroscopy detected via electron yield in He and in vacuum.
- Source :
-
Physical review. B, Condensed matter [Phys Rev B Condens Matter] 1988 Jul 01; Vol. 38 (1), pp. 26-30. - Publication Year :
- 1988
Details
- Language :
- English
- ISSN :
- 0163-1829
- Volume :
- 38
- Issue :
- 1
- Database :
- MEDLINE
- Journal :
- Physical review. B, Condensed matter
- Publication Type :
- Academic Journal
- Accession number :
- 9945159
- Full Text :
- https://doi.org/10.1103/physrevb.38.26