Depth dependence for extended x-ray-absorption fine-structure spectroscopy detected via electron yield in He and in vacuum.

MLA

Elam WT, et al. “Depth Dependence for Extended X-Ray-Absorption Fine-Structure Spectroscopy Detected via Electron Yield in He and in Vacuum.” Physical Review. B, Condensed Matter, vol. 38, no. 1, July 1988, pp. 26–30. EBSCOhost, https://doi.org/10.1103/physrevb.38.26.

APA

Elam WT, Kirkland JP, Neiser RA, & Wolf PD. (1988). Depth dependence for extended x-ray-absorption fine-structure spectroscopy detected via electron yield in He and in vacuum. Physical Review. B, Condensed Matter, 38(1), 26–30. https://doi.org/10.1103/physrevb.38.26

Chicago

Elam WT, Kirkland JP, Neiser RA, and Wolf PD. 1988. “Depth Dependence for Extended X-Ray-Absorption Fine-Structure Spectroscopy Detected via Electron Yield in He and in Vacuum.” Physical Review. B, Condensed Matter 38 (1): 26–30. doi:10.1103/physrevb.38.26.