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Dielectric-Engineered High-Speed, Low-Power, Highly Reliable Charge Trap Flash-Based Synaptic Device for Neuromorphic Computing beyond Inference.

Authors :
Kim JP
Kim SK
Park S
Kuk SH
Kim T
Kim BH
Ahn SH
Cho YH
Jeong Y
Choi SY
Kim S
Source :
Nano letters [Nano Lett] 2023 Jan 25; Vol. 23 (2), pp. 451-461. Date of Electronic Publication: 2023 Jan 13.
Publication Year :
2023

Abstract

The coming of the big-data era brought a need for power-efficient computing that cannot be realized in the Von Neumann architecture. Neuromorphic computing which is motivated by the human brain can greatly reduce power consumption through matrix multiplication, and a device that mimics a human synapse plays an important role. However, many synaptic devices suffer from limited linearity and symmetry without using incremental step pulse programming (ISPP). In this work, we demonstrated a charge-trap flash (CTF)-based synaptic transistor using trap-level engineered Al <subscript>2</subscript> O <subscript>3</subscript> /Ta <subscript>2</subscript> O <subscript>5</subscript> /Al <subscript>2</subscript> O <subscript>3</subscript> gate stack for successful neuromorphic computing. This novel gate stack provided precise control of the conductance with more than 6 bits. We chose the appropriate bias for highly linear and symmetric modulation of conductance and realized it with very short (25 ns) identical pulses at low voltage, resulting in low power consumption and high reliability. Finally, we achieved high learning accuracy in the training of 60000 MNIST images.

Details

Language :
English
ISSN :
1530-6992
Volume :
23
Issue :
2
Database :
MEDLINE
Journal :
Nano letters
Publication Type :
Academic Journal
Accession number :
36637103
Full Text :
https://doi.org/10.1021/acs.nanolett.2c03453