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Porous low dielectric constant materials for microelectronics.

Authors :
Baklanov MR
Maex K
Source :
Philosophical transactions. Series A, Mathematical, physical, and engineering sciences [Philos Trans A Math Phys Eng Sci] 2006 Jan 15; Vol. 364 (1838), pp. 201-15.
Publication Year :
2006

Abstract

Materials with a low dielectric constant are required as interlayer dielectrics for the on-chip interconnection of ultra-large-scale integration devices to provide high speed, low dynamic power dissipation and low cross-talk noise. The selection of chemical compounds with low polarizability and the introduction of porosity result in a reduced dielectric constant. Integration of such materials into microelectronic circuits, however, poses a number of challenges, as the materials must meet strict requirements in terms of properties and reliability. These issues are the subject of the present paper.

Details

Language :
English
ISSN :
1364-503X
Volume :
364
Issue :
1838
Database :
MEDLINE
Journal :
Philosophical transactions. Series A, Mathematical, physical, and engineering sciences
Publication Type :
Academic Journal
Accession number :
18272461
Full Text :
https://doi.org/10.1098/rsta.2005.1679