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Porous low dielectric constant materials for microelectronics.
- Source :
-
Philosophical transactions. Series A, Mathematical, physical, and engineering sciences [Philos Trans A Math Phys Eng Sci] 2006 Jan 15; Vol. 364 (1838), pp. 201-15. - Publication Year :
- 2006
-
Abstract
- Materials with a low dielectric constant are required as interlayer dielectrics for the on-chip interconnection of ultra-large-scale integration devices to provide high speed, low dynamic power dissipation and low cross-talk noise. The selection of chemical compounds with low polarizability and the introduction of porosity result in a reduced dielectric constant. Integration of such materials into microelectronic circuits, however, poses a number of challenges, as the materials must meet strict requirements in terms of properties and reliability. These issues are the subject of the present paper.
Details
- Language :
- English
- ISSN :
- 1364-503X
- Volume :
- 364
- Issue :
- 1838
- Database :
- MEDLINE
- Journal :
- Philosophical transactions. Series A, Mathematical, physical, and engineering sciences
- Publication Type :
- Academic Journal
- Accession number :
- 18272461
- Full Text :
- https://doi.org/10.1098/rsta.2005.1679