Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations

Long-term accelerated degradation tests on InGaN blue light-emitting diodes were performed under continuous and low-speed pulse operations, and the half-life of the optical output was estimated. It was estimated that the lifetime under pulse operation is 2–4 times longer than that in continuous operation. A higher pulse repetition rate confers a longer life. [Copyright &y& Elsevier]