Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations

MLA

Yanagisawa, Takeshi, and Takeshi Kojima. “Degradation of InGaN Blue Light-Emitting Diodes under Continuous and Low-Speed Pulse Operations.” Microelectronics Reliability, vol. 43, no. 6, June 2003, p. 977. EBSCOhost, https://doi.org/10.1016/S0026-2714(03)00093-3.

APA

Yanagisawa, T., & Kojima, T. (2003). Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations. Microelectronics Reliability, 43(6), 977. https://doi.org/10.1016/S0026-2714(03)00093-3

Chicago

Yanagisawa, Takeshi, and Takeshi Kojima. 2003. “Degradation of InGaN Blue Light-Emitting Diodes under Continuous and Low-Speed Pulse Operations.” Microelectronics Reliability 43 (6): 977. doi:10.1016/S0026-2714(03)00093-3.