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Effects of deposition temperature on polycrystalline silicon films using plasma-enhanced chemical...

Authors :
Hasegawa, S.
Sakata, M.
Inokuma, T.
Kurata, Y.
Source :
Journal of Applied Physics. 7/1/1998, Vol. 84 Issue 1, p584. 5p. 1 Chart, 7 Graphs.
Publication Year :
1998

Abstract

Provides information on a study examining the 200-nm-thick polycrystalline silicon films were deposited by changing the deposition temperature (Td = 150-750...C). Methodology used to conduct the study; Incorporation of O and N atoms depending on Td; Findings of the study.

Details

Language :
English
ISSN :
00218979
Volume :
84
Issue :
1
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
867783
Full Text :
https://doi.org/10.1063/1.368085