Soft x-ray resonant magnetic reflectivity study of thin films and multilayers.

Authors :: Tonnerre, J.M.
Seve, L.
Barbara-Dechelette, A.
Bartolome, F.
Raoux, D.
Chakarian, V.
Kao, C.C.
Fischer, H.
Andrieu, S.
Fruchart, O.
Source :: Journal of Applied Physics. 6/1/1998 Part 2 of 2, Vol. 83 Issue 11, p6293. 3p. 8 Graphs.
Publication Year :: 1998
Abstract: Provides soft x-ray resonant magnetic reflectivity measurements of thin films and multilayers. How linear polarized photons were used in the measurement of the thin films and multilayers in a transverse geometry; Quantitative examination of the magnetic properties of thin films and multilayers.

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