Cite
Soft x-ray resonant magnetic reflectivity study of thin films and multilayers.
MLA
Tonnerre, J. M., et al. “Soft X-Ray Resonant Magnetic Reflectivity Study of Thin Films and Multilayers.” Journal of Applied Physics, vol. 83, no. 11, June 1998, p. 6293. EBSCOhost, https://doi.org/10.1063/1.367837.
APA
Tonnerre, J. M., Seve, L., Barbara-Dechelette, A., Bartolome, F., Raoux, D., Chakarian, V., Kao, C. C., Fischer, H., Andrieu, S., & Fruchart, O. (1998). Soft x-ray resonant magnetic reflectivity study of thin films and multilayers. Journal of Applied Physics, 83(11), 6293. https://doi.org/10.1063/1.367837
Chicago
Tonnerre, J.M., L. Seve, A. Barbara-Dechelette, F. Bartolome, D. Raoux, V. Chakarian, C.C. Kao, H. Fischer, S. Andrieu, and O. Fruchart. 1998. “Soft X-Ray Resonant Magnetic Reflectivity Study of Thin Films and Multilayers.” Journal of Applied Physics 83 (11): 6293. doi:10.1063/1.367837.