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Radiative recombination on the interface in a p-GaInAsSb/p-InAs type-II (broken-gap) heterostructure upon pulsed excitation.

Authors :
Bazhenov, N. L.
Zegrya, G. G.
Mikhaılova, M. P.
Moiseev, K. D.
Smirnov,, V. A.
Solov’eva, O. Yu.
Yakovlev, Yu. P.
Source :
Semiconductors. Jun97, Vol. 31 Issue 6, p560. 3p.
Publication Year :
1997

Abstract

The electroluminescence appearing upon pulsed excitation in a solitary p-GaInAsSb/p-InAs typeII (broken-gap) heterostructure is investigated at T = 77 K. It is shown that just as in the case of excitation by a constant current, two emission bands with maxima corresponding to 384 and 311 meV, respectively, are observed in the spectra. The half-widths of the emission bands equal 18-19 meV. Time-resolved spectroscopy is used to evaluate the relaxation time of the nonequilibrium carriers, which amounts to 6-7 µs. The emission spectrum is calculated on the basis of the Kane model, and the radiative recombination time is estimated. The theoretical estimates are in reasonable agreement with experiment. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10637826
Volume :
31
Issue :
6
Database :
Academic Search Index
Journal :
Semiconductors
Publication Type :
Academic Journal
Accession number :
7318224
Full Text :
https://doi.org/10.1134/1.1187218