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The mechanisms underlying the enhanced resolution of atomic force microscopy with functionalized tips.

Authors :
Moll, Nikolaj
Gross, Leo
Mohn, Fabian
Curioni, Alessandro
Meyer, Gerhard
Source :
New Journal of Physics. Dec2010, Vol. 12 Issue 12, p1-15. 15p. 2 Diagrams, 5 Graphs.
Publication Year :
2010

Abstract

By functionalizing the tip of an atomic force microscope (AFM) with a molecule or an atom that significantly contributes to the tip-sample interaction, the resolution can be dramatically enhanced. The interaction and therefore the resolution crucially depend on the chemical nature of the tip termination. Employing a tip functionalized with a CO molecule, atomic resolution of a pentacene molecule was recently demonstrated. In this work, the interaction between the CO tip and the pentacene imaged are studied with first principles calculations. The calculated frequency shifts compare very well with the experiment. The different energy contributions are analyzed and the Pauli energy is computed. We demonstrate that the source of the high resolution is Pauli repulsion, whereas van der Waals and electrostatic interactions only add a diffuse attractive background. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
13672630
Volume :
12
Issue :
12
Database :
Academic Search Index
Journal :
New Journal of Physics
Publication Type :
Academic Journal
Accession number :
62607622
Full Text :
https://doi.org/10.1088/1367-2630/12/12/125020