Cite
The mechanisms underlying the enhanced resolution of atomic force microscopy with functionalized tips.
MLA
Moll, Nikolaj, et al. “The Mechanisms Underlying the Enhanced Resolution of Atomic Force Microscopy with Functionalized Tips.” New Journal of Physics, vol. 12, no. 12, Dec. 2010, pp. 1–15. EBSCOhost, https://doi.org/10.1088/1367-2630/12/12/125020.
APA
Moll, N., Gross, L., Mohn, F., Curioni, A., & Meyer, G. (2010). The mechanisms underlying the enhanced resolution of atomic force microscopy with functionalized tips. New Journal of Physics, 12(12), 1–15. https://doi.org/10.1088/1367-2630/12/12/125020
Chicago
Moll, Nikolaj, Leo Gross, Fabian Mohn, Alessandro Curioni, and Gerhard Meyer. 2010. “The Mechanisms Underlying the Enhanced Resolution of Atomic Force Microscopy with Functionalized Tips.” New Journal of Physics 12 (12): 1–15. doi:10.1088/1367-2630/12/12/125020.