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A Microwave Broadband Technique to Measure the Complex Resistivity of HTS Thin Films.
- Source :
-
IEEE Transactions on Applied Superconductivity . Mar2001 Part 3 of 3, Vol. 11 Issue 1, p3082. 4p. 1 Diagram, 5 Graphs. - Publication Year :
- 2001
-
Abstract
- Evaluates a microwave broadband technique to measure the complex electric resistivity of high temperature superconductor thin films. Extraction of film resistivity from measured reflection coefficients; Electromagnetic analysis of the coaxial circular transition structure; Coaxial line calibration.
Details
- Language :
- English
- ISSN :
- 10518223
- Volume :
- 11
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Applied Superconductivity
- Publication Type :
- Academic Journal
- Accession number :
- 4913068
- Full Text :
- https://doi.org/10.1109/77.919714