A Microwave Broadband Technique to Measure the Complex Resistivity of HTS Thin Films.

MLA

Tosoratti, Nevio, et al. “A Microwave Broadband Technique to Measure the Complex Resistivity of HTS Thin Films.” IEEE Transactions on Applied Superconductivity, vol. 11, no. 1, Mar. 2001, p. 3082. EBSCOhost, https://doi.org/10.1109/77.919714.

APA

Tosoratti, N., Fastampa, R., Giura, M., Lenzi, V., Sarti, S., & Silva, E. (2001). A Microwave Broadband Technique to Measure the Complex Resistivity of HTS Thin Films. IEEE Transactions on Applied Superconductivity, 11(1), 3082. https://doi.org/10.1109/77.919714

Chicago

Tosoratti, Nevio, Renato Fastampa, Maurizio Giura, Vasco Lenzi, Stefano Sarti, and Enrico Silva. 2001. “A Microwave Broadband Technique to Measure the Complex Resistivity of HTS Thin Films.” IEEE Transactions on Applied Superconductivity 11 (1): 3082. doi:10.1109/77.919714.