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Highly selective electroplated nickel mask for lithium niobate dry etching.

Authors :
Benchabane, Sarah
Robert, Laurent
Rauch, Jean-Yves
Khelif, Abdelkrim
Laude, Vincent
Source :
Journal of Applied Physics. May2009, Vol. 105 Issue 9, p094109-1-094109-6. 6p. 5 Black and White Photographs, 1 Diagram, 2 Charts, 2 Graphs.
Publication Year :
2009

Abstract

A sulfur hexafluoride based reactive ion etching process allowing to etch several micron deep holes with diameters of the order of a few microns in lithium niobate is reported. Etching of deep structures with aspect ratios up to 1.5 was made possible through the use of an electroplated nickel mask exhibiting a selectivity as high as 20 with respect to lithium niobate. Several crystallograpic orientations were investigated, although particular interest was paid to Y-axis oriented substrates. Photoresist as well as metal masks were also tested and their selectivity was compared. The influence of process parameters such as applied rf power or operating pressure on the sidewall slope angle of the etched patterns was investigated. The technique has been successfully applied to the fabrication of phononic crystals consisting of periodical arrays of 9 μm diameter, 10 μm deep holes, with a 10 μm period, and presenting sidewall angles as high as 73° etched in Y-axis oriented lithium niobate. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
105
Issue :
9
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
39786025
Full Text :
https://doi.org/10.1063/1.3125315