Back to Search Start Over

Oscillation of the cantilever in atomic force microscopy: Probing the sample response at the...

Authors :
Bouhacina, T.
Michel, D.
Aimé, J. P.
Gauthier, S.
Source :
Journal of Applied Physics. 10/15/1997, Vol. 82 Issue 8, p3652. 9p. 3 Diagrams, 2 Charts, 11 Graphs.
Publication Year :
1997

Abstract

Examines the relaxation of the microlever of the atomic force microscope after the unsticking instability. Different oscillating behavior in the polymer chain; Use of a rheological model in describing the different features of the atomic force microscope; Description of a microlever coupled to a polymer network.

Subjects

Subjects :
*ATOMIC force microscopy

Details

Language :
English
ISSN :
00218979
Volume :
82
Issue :
8
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
295024
Full Text :
https://doi.org/10.1063/1.365727