Oscillation of the cantilever in atomic force microscopy: Probing the sample response at the...

MLA

Bouhacina, T., et al. “Oscillation of the Cantilever in Atomic Force Microscopy: Probing the Sample Response at The..” Journal of Applied Physics, vol. 82, no. 8, Oct. 1997, p. 3652. EBSCOhost, https://doi.org/10.1063/1.365727.

APA

Bouhacina, T., Michel, D., Aimé, J. P., & Gauthier, S. (1997). Oscillation of the cantilever in atomic force microscopy: Probing the sample response at the.. Journal of Applied Physics, 82(8), 3652. https://doi.org/10.1063/1.365727

Chicago

Bouhacina, T., D. Michel, J. P. Aimé, and S. Gauthier. 1997. “Oscillation of the Cantilever in Atomic Force Microscopy: Probing the Sample Response at The..” Journal of Applied Physics 82 (8): 3652. doi:10.1063/1.365727.