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Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator.
- Source :
-
Applied Physics Letters . 9/26/2005, Vol. 87 Issue 13, p133114. 3p. 1 Black and White Photograph, 1 Diagram, 2 Graphs. - Publication Year :
- 2005
-
Abstract
- Using a 1 MHz length-extension type of quartz resonator as a force sensor for frequency-modulation atomic force microscopy (AFM), atomically resolved images of the Si(111)-(7×7) surface was obtained. Fabrications of a tip attached at the front end of the resonator by focused ion beam, and removal of the native oxide layer on the tip by in-situ field ion microscopy are found effective for achieving the highly-resolved AFM imaging. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 87
- Issue :
- 13
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 18856766
- Full Text :
- https://doi.org/10.1063/1.2061850