Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator.

MLA

An, Toshu, et al. “Atomically-Resolved Imaging by Frequency-Modulation Atomic Force Microscopy Using a Quartz Length-Extension Resonator.” Applied Physics Letters, vol. 87, no. 13, Sept. 2005, p. 133114. EBSCOhost, https://doi.org/10.1063/1.2061850.

APA

An, T., Eguchi, T., Akiyama, K., & Hasegawa, Y. (2005). Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator. Applied Physics Letters, 87(13), 133114. https://doi.org/10.1063/1.2061850

Chicago

An, Toshu, Toyoaki Eguchi, Kotone Akiyama, and Yukio Hasegawa. 2005. “Atomically-Resolved Imaging by Frequency-Modulation Atomic Force Microscopy Using a Quartz Length-Extension Resonator.” Applied Physics Letters 87 (13): 133114. doi:10.1063/1.2061850.