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Growth kinetics study in halide chemical vapor deposition of SiC

Authors :
Nigam, S.
Chung, H.J.
Polyakov, A.Y.
Fanton, M.A.
Weiland, B.E.
Snyder, D.W.
Skowronski, M.
Source :
Journal of Crystal Growth. Oct2005, Vol. 284 Issue 1/2, p112-122. 11p.
Publication Year :
2005

Abstract

Abstract: Growth rates of high-purity single-crystal 6H-SiC have been studied as a function of growth conditions during chemical vapor deposition process using silicon tetrachloride, propane, and hydrogen as reactants. The growth temperature ranged from 2000 to 2150°C. High-quality SiC crystals were deposited at growth rates in the 100–300μm/h range in both silicon- and carbon-supply limited regimes by adjusting flows of all three reactants. The results have been interpreted using thermodynamic equilibrium calculations. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00220248
Volume :
284
Issue :
1/2
Database :
Academic Search Index
Journal :
Journal of Crystal Growth
Publication Type :
Academic Journal
Accession number :
18360578
Full Text :
https://doi.org/10.1016/j.jcrysgro.2005.06.027