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Phase singularities in analytic signal of white-light speckle pattern with application to micro-displacement measurement
- Source :
-
Optics Communications . Apr2005, Vol. 248 Issue 1-3, p59-68. 10p. - Publication Year :
- 2005
-
Abstract
- Abstract: Rather than regarding the phase singularities as obstacles or nuisances in phase unwrapping, we explore new possibilities of making use of the phase singularities in optical metrology. Instead of intensity correlation techniques used in conventional speckle metrology, we propose a new technique of displacement measurement that makes use of the density of phase singularities in the complex analytic signal of the speckle pattern, which is generated by Hilbert filtering. Experimental results and theoretical analysis are presented that demonstrate the validity of the proposed technique. [Copyright &y& Elsevier]
- Subjects :
- *LIGHT scattering
*OPTICAL measurements
*OPTICS
*OPTICAL diffraction
*HOLOGRAPHY
Subjects
Details
- Language :
- English
- ISSN :
- 00304018
- Volume :
- 248
- Issue :
- 1-3
- Database :
- Academic Search Index
- Journal :
- Optics Communications
- Publication Type :
- Academic Journal
- Accession number :
- 17613879
- Full Text :
- https://doi.org/10.1016/j.optcom.2004.11.101