Cite
Phase singularities in analytic signal of white-light speckle pattern with application to micro-displacement measurement
MLA
Wang, Wei, et al. “Phase Singularities in Analytic Signal of White-Light Speckle Pattern with Application to Micro-Displacement Measurement.” Optics Communications, vol. 248, no. 1–3, Apr. 2005, pp. 59–68. EBSCOhost, https://doi.org/10.1016/j.optcom.2004.11.101.
APA
Wang, W., Ishii, N., Hanson, S. G., Miyamoto, Y., & Takeda, M. (2005). Phase singularities in analytic signal of white-light speckle pattern with application to micro-displacement measurement. Optics Communications, 248(1–3), 59–68. https://doi.org/10.1016/j.optcom.2004.11.101
Chicago
Wang, Wei, Nobuo Ishii, Steen G. Hanson, Yoko Miyamoto, and Mitsuo Takeda. 2005. “Phase Singularities in Analytic Signal of White-Light Speckle Pattern with Application to Micro-Displacement Measurement.” Optics Communications 248 (1–3): 59–68. doi:10.1016/j.optcom.2004.11.101.