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Quasi Real-Time Apple Defect Segmentation Using Deep Learning.
- Source :
-
Sensors (14248220) . Sep2023, Vol. 23 Issue 18, p7893. 19p. - Publication Year :
- 2023
-
Abstract
- Defect segmentation of apples is an important task in the agriculture industry for quality control and food safety. In this paper, we propose a deep learning approach for the automated segmentation of apple defects using convolutional neural networks (CNNs) based on a U-shaped architecture with skip-connections only within the noise reduction block. An ad-hoc data synthesis technique has been designed to increase the number of samples and at the same time to reduce neural network overfitting. We evaluate our model on a dataset of multi-spectral apple images with pixel-wise annotations for several types of defects. In this paper, we show that our proposal outperforms in terms of segmentation accuracy general-purpose deep learning architectures commonly used for segmentation tasks. From the application point of view, we improve the previous methods for apple defect segmentation. A measure of the computational cost shows that our proposal can be employed in real-time (about 100 frame-per-second on GPU) and in quasi-real-time (about 7/8 frame-per-second on CPU) visual-based apple inspection. To further improve the applicability of the method, we investigate the potential of using only RGB images instead of multi-spectral images as input images. The results prove that the accuracy in this case is almost comparable with the multi-spectral case. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 14248220
- Volume :
- 23
- Issue :
- 18
- Database :
- Academic Search Index
- Journal :
- Sensors (14248220)
- Publication Type :
- Academic Journal
- Accession number :
- 172417757
- Full Text :
- https://doi.org/10.3390/s23187893