Quasi Real-Time Apple Defect Segmentation Using Deep Learning.

MLA

Agarla, Mirko, et al. “Quasi Real-Time Apple Defect Segmentation Using Deep Learning.” Sensors (14248220), vol. 23, no. 18, Sept. 2023, p. 7893. EBSCOhost, https://doi.org/10.3390/s23187893.

APA

Agarla, M., Napoletano, P., & Schettini, R. (2023). Quasi Real-Time Apple Defect Segmentation Using Deep Learning. Sensors (14248220), 23(18), 7893. https://doi.org/10.3390/s23187893

Chicago

Agarla, Mirko, Paolo Napoletano, and Raimondo Schettini. 2023. “Quasi Real-Time Apple Defect Segmentation Using Deep Learning.” Sensors (14248220) 23 (18): 7893. doi:10.3390/s23187893.