Back to Search
Start Over
Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging.
- Source :
-
Sensors (14248220) . Aug2022, Vol. 22 Issue 15, p5890-N.PAG. 20p. - Publication Year :
- 2022
-
Abstract
- In this work, we investigate the potential of employing a direct conversion integration mode X-ray detector with micron-scale pixels in two different X-ray phase-contrast imaging (XPCi) configurations, propagation-based (PB) and edge illumination (EI). Both PB-XPCi and EI-XPCi implementations are evaluated through a wave optics model—numerically simulated in MATLAB—and are compared based on their contrast, edge-enhancement, visibility, and dose efficiency characteristics. The EI-XPCi configuration, in general, demonstrates higher performance compared to PB-XPCi, considering a setup with the same X-ray source and detector. However, absorption masks quality (thickness of X-ray absorption material) and environmental vibration effect are two potential challenges for EI-XPCi employing a detector with micron-scale pixels. Simulation results confirm that the behavior of an EI-XPCi system employing a high-resolution detector is susceptible to its absorption masks thickness and misalignment. This work demonstrates the potential and feasibility of employing a high-resolution direct conversion detector for phase-contrast imaging applications where higher dose efficiency, higher contrast images, and a more compact imaging system are of interest. [ABSTRACT FROM AUTHOR]
- Subjects :
- *X-ray imaging
*DETECTORS
*PIXELS
*IMAGING systems
*X-rays
Subjects
Details
- Language :
- English
- ISSN :
- 14248220
- Volume :
- 22
- Issue :
- 15
- Database :
- Academic Search Index
- Journal :
- Sensors (14248220)
- Publication Type :
- Academic Journal
- Accession number :
- 158550483
- Full Text :
- https://doi.org/10.3390/s22155890