Cite
Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging.
MLA
Pil-Ali, Abdollah, et al. “Direct Conversion X-Ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-Ray Phase-Contrast Imaging.” Sensors (14248220), vol. 22, no. 15, Aug. 2022, p. 5890–N.PAG. EBSCOhost, https://doi.org/10.3390/s22155890.
APA
Pil-Ali, A., Adnani, S., Scott, C. C., & Karim, K. S. (2022). Direct Conversion X-ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-ray Phase-Contrast Imaging. Sensors (14248220), 22(15), 5890–N.PAG. https://doi.org/10.3390/s22155890
Chicago
Pil-Ali, Abdollah, Sahar Adnani, Christopher C. Scott, and Karim S. Karim. 2022. “Direct Conversion X-Ray Detector with Micron-Scale Pixel Pitch for Edge-Illumination and Propagation-Based X-Ray Phase-Contrast Imaging.” Sensors (14248220) 22 (15): 5890–N.PAG. doi:10.3390/s22155890.