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Derivation of a Universal Charge Model for Multigate MOS Structures With Arbitrary Cross Sections.

Authors :
Lee, Kwang-Woon
Hong, Sung-Min
Source :
IEEE Transactions on Electron Devices. Jun2022, Vol. 69 Issue 6, p3014-3021. 8p.
Publication Year :
2022

Abstract

A universal equation for the charge-voltage characteristics in the multigate metal oxide semiconductor (MOS) structure with an arbitrary cross section is presented. A generalized coordinate is proposed and the Poisson equation is integrated with a weighting factor related with the generalized coordinate and the electric field. A compact charge model is derived and analytic and numerical examples for various MOS structures are shown. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
69
Issue :
6
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
157582702
Full Text :
https://doi.org/10.1109/TED.2022.3164862