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Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80th, 75th and 80th birthdays.

Authors :
Dunin-Borkowski, Rafal E.
Mayer, Joachim
Sachse, Carsten
Tillmann, Karsten
Source :
Ultramicroscopy. Dec2021, Vol. 231, pN.PAG-N.PAG. 1p.
Publication Year :
2021

Subjects

Subjects :
*ELECTRON microscopy
*BIRTHDAYS

Details

Language :
English
ISSN :
03043991
Volume :
231
Database :
Academic Search Index
Journal :
Ultramicroscopy
Publication Type :
Academic Journal
Accession number :
153957604
Full Text :
https://doi.org/10.1016/j.ultramic.2021.113290