Cite
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80th, 75th and 80th birthdays.
MLA
Dunin-Borkowski, Rafal E., et al. “Introduction to a Special Issue on Frontiers of Aberration Corrected Electron Microscopy in Honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the Occasion of Their 75th, 80th, 75th and 80th Birthdays.” Ultramicroscopy, vol. 231, Dec. 2021, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.ultramic.2021.113290.
APA
Dunin-Borkowski, R. E., Mayer, J., Sachse, C., & Tillmann, K. (2021). Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80th, 75th and 80th birthdays. Ultramicroscopy, 231, N.PAG. https://doi.org/10.1016/j.ultramic.2021.113290
Chicago
Dunin-Borkowski, Rafal E., Joachim Mayer, Carsten Sachse, and Karsten Tillmann. 2021. “Introduction to a Special Issue on Frontiers of Aberration Corrected Electron Microscopy in Honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the Occasion of Their 75th, 80th, 75th and 80th Birthdays.” Ultramicroscopy 231 (December): N.PAG. doi:10.1016/j.ultramic.2021.113290.