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Development of Self‐Heated Stage Suitable for Thermal Assist Reactive Ion Etching of the Functional Metals.

Development of Self‐Heated Stage Suitable for Thermal Assist Reactive Ion Etching of the Functional Metals.

Authors :
MURATA, Y. U. K. I.
HAN, G. A. N. G.
OHKAWA, D. A. I. K. I.
IMAI, J. U. N. I. C. H. I.
SOHGAWA, M. A. S. A. Y. U. K. I.
ABE, T. A. K. A. S. H. I.
Source :
Electronics & Communications in Japan. Mar2018, Vol. 101 Issue 3, p96-102. 7p.
Publication Year :
2018

Abstract

SUMMARY: This paper describes development of self‐heated stage suitable for thermal reactive ion etching (TRIE) of the functional metals. TRIE was evaluated using both experiments and simulations for etching functional metals. The self‐heated stage was designed based on the simulation results. TRIE employs a self‐heated stage which is thermally insulated aluminum plate as the etching stage of a regular RIE apparatus. The stage temperature increases rapidly within 10 min and etch rate does not depend on process time. TRIE technique was used to etch various kinds of functional metals: Ti, Mo, Ta, Nb, and Ti alloy (Ti‐6Al‐4V). It did improve the etching rate of these materials greatly. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
19429533
Volume :
101
Issue :
3
Database :
Academic Search Index
Journal :
Electronics & Communications in Japan
Publication Type :
Academic Journal
Accession number :
127875865
Full Text :
https://doi.org/10.1002/ecj.12046