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FIB/SEM WORKSHOP.
- Source :
-
Electronic Device Failure Analysis . Feb2016, Vol. 18 Issue 1, p12-12. 1/8p. - Publication Year :
- 2016
-
Abstract
- The article offers information on the ninth annual FIB/SEM Workshop to be held at the Kossiakoff Center at Johns Hopkins Applied Physics Laboratory in Laurel, Maryland on February 25, 2016.
- Subjects :
- *FOCUSED ion beams
*SCANNING electron microscopes
*CONFERENCES & conventions
Subjects
Details
- Language :
- English
- ISSN :
- 15370755
- Volume :
- 18
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- Electronic Device Failure Analysis
- Publication Type :
- Academic Journal
- Accession number :
- 112392537