Cite
FIB/SEM WORKSHOP.
MLA
“Fib/Sem Workshop.” Electronic Device Failure Analysis, vol. 18, no. 1, Feb. 2016, p. 12. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=asx&AN=112392537&authtype=sso&custid=ns315887.
APA
Fib/Sem Workshop. (2016). Electronic Device Failure Analysis, 18(1), 12.
Chicago
“Fib/Sem Workshop.” 2016. Electronic Device Failure Analysis 18 (1): 12. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=asx&AN=112392537&authtype=sso&custid=ns315887.