18 results on '"charge-pumping"'
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2. Charge-pumping characterization of FILOX vertical MOSFETs
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3. Characterization of SOI MOSFETs by means of charge-pumping
4. A propagation concept of negative bias temperature instability along the channel length in p-type metal oxide field effect transistor
5. Investigation of voltage-swing effect and trap generation in high-k gate dielectric of MOS devices by charge-pumping measurement
6. Arbitrary waveform generator for charge-pumping.
7. Charge-pumping characterization of FILOX vertical MOSFETs.
8. Characterization of SOI MOSFETs by means of charge-pumping.
9. Charge-pumping characterization of SOI devices fabricated by means of wafer bonding over pre-patterned cavities.
10. Investigation of Programming Charge Distribution in Nonoverlapped Implantation nMOSFETs.
11. Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique
12. A New Oxide-Trap Based on Charge-Pumping (OTCP) Extraction Method for Irradiated MOSFET Devices: Part II (Low Frequencies).
13. A New Oxide-Trap Based on Charge-Pumping (OTCP) Extraction Method for Irradiated MOSFET Devices: Part I (High Frequencies).
14. A coupled I(V) and charge-pumping analysis of Stress Induced Leakage Currents in 5nm-thick gate oxides
15. Charakterisierung von Gate-Oxiden mittels Charge-Pumping und 1/ f-Rauschanalysen
16. Charge-pumping characterization of SOI devices fabricated by means of wafer bonding over pre-patterned cavities
17. Comparison of degradation modes in 1.2–2.1 nm thick SiO2 oxides submitted to uniform and hot carrier injections in NMOSFETS
18. Efficiency of interface trap generation under hole injections in 2.1 nm thick gate-oxide P-MOSFETs
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