1. Radiation effects in micro-electromechanical systems (MEMS): RF relays
- Author
-
McClure, Steven S., Edmonds, L.D., Mihailovich, R., Johnston, A.H., Alonzo, P., DeNatale, J., Lehman, J., and Yui, C.
- Subjects
Electromechanical devices -- Testing ,Radiation -- Measurement ,Business ,Electronics ,Electronics and electrical industries - Abstract
GaAs micro-electromechanical RF relays fabricated by surface micromachining techniques were characterized for their response to total ionizing dose. Microrelays with two different geometries were studied. For one geometry, changes in switch actuation voltage at moderate dose levels were observed. For an alternative geometry, no change in actuation voltage was observed. A mechanism for dielectric charge trapping and its effect on the electrostatic force is proposed. Micro-electromechanical devices, radiation effects, RF switch.
- Published
- 2002