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Total dose bias dependency and ELDRS effects in bipolar linear devices
- Publication Year :
- 2002
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 2002.
-
Abstract
- Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias during exposure. All devices exhibited Enhanced Low Dose Rate Sensitivity (ELDRS). An accelerated ELDRS test method for three different devices demonstrate results similar to tests at low dose rate. Behavior and critical parameters from these tests are compared and discussed.
- Subjects :
- Space Radiation
Subjects
Details
- Language :
- English
- Database :
- NASA Technical Reports
- Publication Type :
- Report
- Accession number :
- edsnas.20060030076
- Document Type :
- Report