16 results on '"Weulersse, C."'
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2. Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool
3. DASIE analytical version: a predictive tool for neutrons, protons and heavy ions induced SEU cross section
4. Neutron sensitivity of high voltage SiC devices for avionics applications
5. Cosmic ray immunity of COTS Normally-Off Power GaN FETs for space, aeronautic and automotive applications
6. Silicon carbide power MOSFETs under neutron irradiation: Failure In Time demonstration and long term reliability degradation evaluation
7. Study of the Contribution of Latent Defects Induced by Swift Heavy Ion Irradiation on the Gate Oxide Breakdown
8. 30 MeV and 63 MeV neutron induced energy deposition in a silicon diode: Experimental validation of Monte Carlo simulation
9. Study of Latent Defects Induced by Swift Heavy Ion Irradiation on MOS Devices Gate Oxide
10. Investigation of 14 MeV Neutron Capabilities for SEU Hardness Evaluation
11. Test methodology of a new upset mechanism induced by protons in deep sub-micron devices
12. Investigation of the influence of process and design on soft error rate in integrated CMOS technologies thanks to Monte Carlo simulation
13. Probing SET sensitive volumes in linear devices using focused laser beam at different wavelengths
14. Use of nuclear data for space and aeronautic designs
15. DASIE Analytical Version: A Predictive Tool for Neutrons, Protons and Heavy Ions Induced SEU Cross Section
16. A review of DASIE code family: contribution to SEU/MBU understanding
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